Quek Wei Chun, Pang Wai Leong, Chan Kah Yoong, Lee It Ee and Chung Gwo Chin (2020) “VHDL Modelling of Low-Cost Memory Fault Detection Tester ”, Journal of Engineering Technology and Applied Physics, 2(2), pp. 17–23. doi: 10.33093/jetap.2020.2.2.3.