QUEK WEI CHUN; PANG WAI LEONG; CHAN KAH YOONG; LEE IT EE; CHUNG GWO CHIN. VHDL Modelling of Low-Cost Memory Fault Detection Tester . Journal of Engineering Technology and Applied Physics, [S. l.], v. 2, n. 2, p. 17–23, 2020. DOI: 10.33093/jetap.2020.2.2.3. Disponível em: https://journals.mmupress.com/index.php/jetap/article/view/99. Acesso em: 21 apr. 2025.